Chongfan Technology
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Nanoindentation instrument
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Technical Data
The Nano Indenter G200X provides an easy-to-use nanoscale mechanical testing tool, enabling rapid and precise quantitative analysis of results. The G200X system is equipped with our highest‑performing motion stage, the largest sample‑handling capacity, and a high‑resolution optical microscope. Thanks to InView software, the iQWave2 controller, and the InForce actuator, our entire indentation product line delivers outstanding performance. Optional features for the G200X include Continuous Stiffness Measurement (CSM), scanning probe microscopy, scratch testing, frequency sweep, electrical property measurements, rapid indentation testing, and impact testing.
Main Features
● Electromagnetic actuators enable wide‑range control of both load and displacement.
● The combination of a high-resolution optical microscope with a precision XYZ positioning system enables high-accuracy observation and precise localization of test samples.
● A convenient sample-loading stage and multi-sample positioning capability enable high-throughput testing.
● The module options go far beyond indentation testing, offering modular upgradeable features such as SPM imaging, scratch testing, high-temperature nanoindentation, dynamic indentation (continuous stiffness measurement), and rapid indentation testing.
● An intuitive user interface enables rapid test configuration; parameter settings can be completed with just a few mouse clicks.
● Real-time, high-efficiency experimental control, along with simple and user-friendly test‑procedure development and test configuration.
● The complete InView software suite, including ReviewData and InFocus for data analysis and report generation.
● The highly acclaimed rapid nanoindentation testing can be used to generate images of material mechanical properties and enhance the reliability of statistical data.
● iQWave2 high-speed digital controller, with a maximum data acquisition rate of 100 kHz and a fastest time constant of 16 µs.
Main applications
● Rapid hardness and modulus measurements (based on the Oliver–Pharr model)
● Rapid imaging of surface mechanical properties of materials
● ISO 14577 Hardness Testing
● Thin Film and Coating Testing
● Interface Adhesion Measurement
● Fracture toughness measurement
● Viscoelastic measurements, including the loss factor, storage modulus, and loss modulus
● Scanning probe microscopy (3D imaging)
● Quantitative scratch and friction‑wear testing
● High-Temperature Nanoindentation Testing
● I-V testing
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Address: Room 403, Building 6, Phase III of R&D, No. 36 Xiyong Avenue, High tech Zone, Chongqing, China.
Telephone: +86-13658337211
E-mail: Sales@cfkeji.net
Website: www.cfkeji.net
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