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Super-Depth-of-Field 3D Microscopy System

In addition to its ultra‑high‑level 4K CMOS sensor and 4K‑compatible lenses, it features an Advanced Optical Shadow Effect Mode that can even reveal minute surface irregularities that are otherwise invisible. Equipped with a brand‑new operating system for intuitive operation, it includes an anomaly‑detection function that instantly and automatically identifies differences, a large 300 mm stage with an analysis area nine times that of conventional platforms, and a high‑resolution rotating objective lens compatible with metallographic microscopes—making it a cutting‑edge microscopy system that supports a wide range of analytical applications through extensive customization.

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Digital Microscopy System

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“Search Illumination” that automatically highlights defects

Observations are conducted while the illumination is continuously switched in real time.
Automatic enhancement of subtle shapes.
It is widely used in various applications, including visual inspection and research and development.

“Advanced Optical Shadow Effect Mode” that highlights the true surface condition

By combining multi-directional light sources, even minute surface irregularities that are otherwise invisible can be clearly observed.

Super-Depth-of-Field 3D Microscopy System

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