Chongfan Technology
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18
2026
-
05
Chip-integrated metasurface for ultra-large dynamic range wavefront sensing
Author:
The team of Tao Li and Xian Long at Nanjing University has developed a novel chip-integrated metasurface Shack–Hartmann sensor that is directly integrated onto a complementary metal–oxide–semiconductor (CMOS) image sensor, eliminating the need for external optical components. Their dual‑encoding strategy leverages directionally encoded double‑helical point spread functions to extend the dynamic range of each channel to ±9.4° without reducing sampling density; meanwhile, orthogonal circularly polarized channels with distinct lobe spacings double the sampling density without compromising dynamic range. This architecture inherently supports vector wavefront sensing. The authors demonstrate three-dimensional localization of point sources, lens profile measurement, and video‑rate dynamic wavefront monitoring, thereby establishing a scalable, alignment‑free, high‑performance metrology platform.
The research findings were published in Nature Communications on May 12, 2026, under the title “Chip-integrated metasurface with double-helix point spread functions for ultra-large dynamic range wavefront sensing.”
Figure 1: Design of the metasurface wavefront sensor
Figure 2: Experimental characterization of the metasurface wavefront sensor
Figure 3: 3D Localization of a Point Source
Figure 4: Lens Surface Profile Measurement
Figure 5: Dynamic Wavefront Measurement at Video Frame Rates
Source: Optics World
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