Chongfan Technology
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Product
Birefringent imaging system
Classification：
Detail
Parameters
Technical Data
Built-in 633 nm LED light source
Measurement of sample retardation at maximum half-wave (316 nm) and azimuth angle at maximum ± 90 °
Ø20mm field of view
Include Windows®Software package (see Software tab)
The two modes provide two measurement accuracy ranges: standard delay range and low delay range. Standard retardation provides ± 10 nm retardation measurement accuracy from 0 to 316 nm and ± 3 ° azimuth measurement accuracy over the entire measurement range. The low retardation provides ± 1 nm retardation measurement accuracy from 0 to 100 nm and ± 1 ° azimuth measurement accuracy over the entire measurement range. The shortest exposure time is 0.021 ms and the longest exposure time is 7330 ms.
Screenshots of the user interface for the different measurement display modes are shown below. The preview, 1D, 2D, and 3D views are all obtained using an m = 2 zero-order vortex half-wave plate.
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Address: Room 403, Building 6, Phase III of R&D, No. 36 Xiyong Avenue, High tech Zone, Chongqing, China.
Telephone: +86-13658337211
E-mail: Sales@cfkeji.net
Website: www.cfkeji.net
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